首页> 外文OA文献 >Observation and experimental investigation of confinement effects on ion transport and electrokinetic flows at the microscale
【2h】

Observation and experimental investigation of confinement effects on ion transport and electrokinetic flows at the microscale

机译:微观尺度上对离子迁移和电动流动的约束作用的观察和实验研究

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。
获取外文期刊封面目录资料

摘要

Electrokinetic effects adjacent to charge-selective interfaces (CSI) have been experimentally investigated in microfluidic platforms in order to gain understanding on underlying phenomena of ion transport at elevated applied voltages. We experimentally investigate the influence of geometry and multiple array densities of the CSI on concentration and flow profiles in a microfluidic set-up using nanochannels as the CSI. Particle tracking obtained under chronoamperometric measurements show the development of vortices in the microchannel adjacent to the nanochannels. We found that the direction of the electric field and the potential drop inside the microchannel has a large influence on the ion transport through the interface, for example by inducing immediate wall electroosmotic flow. In microfluidic devices, the electric field may not be directed normal to the interface, which can result in an inefficient use of the CSI. Multiple vortices are observed adjacent to the CSI, growing in size and velocity as a function of time and dependent on their location in the microfluidic device. Local velocities inside the vortices are measured to be more than 1.5 mm/s. Vortex speed, as well as flow speed in the channel, are dependent on the geometry of the CSI and the distance from the electrode.
机译:在微流体平台上,已经对与电荷选择界面(CSI)相邻的电动效应进行了实验研究,以了解在升高的施加电压下离子迁移的潜在现象。我们实验研究了使用纳米通道作为CSI的微流体设置中CSI的几何形状和多个阵列密度对浓度和流量分布的影响。在计时电流法测量下获得的粒子跟踪显示了与纳米通道相邻的微通道中涡旋的发展。我们发现,电场的方向和微通道内部的电势下降对离子通过界面的传输有很大影响,例如通过诱导立即的壁电渗流。在微流体设备中,电场可能不会垂直于界面定向,这可能导致CSI的使用效率低下。在CSI附近观察到多个涡旋,涡旋的大小和速度随时间增长,并取决于它们在微流控设备中的位置。漩涡内部的局部速度被测量为大于1.5mm / s。涡流速度以及通道中的流速取决于CSI的几何形状以及与电极的距离。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号